We provide DFT (Design for Test) services to help customers achieve high test coverage, manufacturability, and reliable silicon performance. Our offerings include scan insertion, MBIST/LBIST implementation, boundary scan integration, ATPG and fault simulation, test point insertion, and DFT-aware verification. These services ensure your designs are optimized for production testing and first-pass silicon success.
DFT Services
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Test requirements and specification analysis
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DFT architecture and strategy development
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Scan insertion (full-scan/partial-scan) and optimization
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Memory BIST (MBIST) and Logic BIST (LBIST) implementation
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Boundary scan (JTAG/IEEE 1149.x) integration
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ATPG (Automatic Test Pattern Generation) and fault simulation
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Test point insertion for coverage improvement
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Low-power DFT techniques and power-aware test integration
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Test compression and diagnosis solutions
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DFT-aware RTL and gate-level verification
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SDC constraint definition for test modes
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DFT documentation, sign-off, and release management